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One electron-controlled multiple-valued dynamic random-access-memory.

Authors :
Kye, H. W.
Song, B. N.
Lee, S. E.
Kim, J. S.
Shin, S. J.
Choi, J. B.
Yu, Y.-S.
Takahashi, Y.
Source :
AIP Advances; 2016, Vol. 6 Issue 2, p1-5, 5p
Publication Year :
2016

Abstract

We propose a new architecture for a dynamic random-access-memory (DRAM) capable of storing multiple values by using a single-electron transistor (SET). The gate of a SET is designed to be connected to a plurality of DRAM unit cells that are arrayed at intersections of word lines and bitlines. In this SET-DRAM hybrid scheme, the multiple switching characteristics of SET enables multiple value data stored in a DRAM unit cell, and this increases the storage functionality of the device. Moreover, since refreshing data requires only a small amount of SET driving current, this enables device operating with low standby power consumption. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21583226
Volume :
6
Issue :
2
Database :
Complementary Index
Journal :
AIP Advances
Publication Type :
Academic Journal
Accession number :
113472978
Full Text :
https://doi.org/10.1063/1.4942901