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The Next Quantum Leap in Form Measurement.

Authors :
NUGENT, PAT
Source :
Quality; Mar2016, Vol. 55 Issue 3, p25-30, 6p
Publication Year :
2016

Abstract

The article focuses on the quantum leap in manufacturing's form measurement. Topics discussed include the shift of the manufacturing industry towards the requirements for micron level tolerance, the small but important impact of the quantum leap, the error compensation, and the all-inclusive strategy of measurement.

Details

Language :
English
ISSN :
03609936
Volume :
55
Issue :
3
Database :
Complementary Index
Journal :
Quality
Publication Type :
Periodical
Accession number :
113230784