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Advances and challenges in cryo ptychography at the Advanced Photon Source.

Authors :
Deng, J.
Vine, D. J.
Chen, S.
Nashed, Y. S. G.
Jin, Q.
Peterka, T.
Vogt, S.
Jacobsen, C.
Source :
AIP Conference Proceedings; 2015, p1-6, 6p, 2 Black and White Photographs, 1 Graph
Publication Year :
2015

Abstract

Ptychography has emerged as a nondestructive tool to quantitatively study extended samples at a high spatial resolution. In this manuscript, we report on recent developments from our team. We have combined cryo ptychography and fluorescence microscopy to provide simultaneous views of ultrastructure and elemental composition, we have developed multi-GPU parallel computation to speed up ptychographic reconstructions, and we have implemented fly-scan ptychography to allow for faster data acquisition. We conclude with a discussion of future challenges in high-resolution 3D ptychography. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
112689478
Full Text :
https://doi.org/10.1063/1.4937524