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Holisitic device exploration for 7nm node.

Authors :
Raghavan, P.
Bardon, M. Garcia
Jang, D.
Schuddinck, P.
Yakimets, D.
Ryckaert, J.
Mercha, A.
Horiguchi, N.
Collaert, N.
Mocuta, A.
Mocuta, D.
Tokei, Z.
Verkest, D.
Thean, A.
Steegen, A.
Source :
2015 IEEE Custom Integrated Circuits Conference (CICC); 2015, p1-5, 5p
Publication Year :
2015

Details

Language :
English
ISBNs :
9781479986828
Database :
Complementary Index
Journal :
2015 IEEE Custom Integrated Circuits Conference (CICC)
Publication Type :
Conference
Accession number :
111585548
Full Text :
https://doi.org/10.1109/CICC.2015.7338377
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