ESD characterization of diodes and ggMOS in Germanium FinFET technologies.

Authors :: Boschke, Roman
Linten, Dimitri
Hellings, Geert
Shih-Hung Chen
Scholz, Mirko
Mitard, Jerome
Witters, Liesbeth
Collaert, Nadine
Thean, Aaron
Groeseneken, Guido
Source :: 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2015, p1-9, 9p
Publication Year :: 2015

Language :: English
ISBNs :: 9781585372737
Database :: Complementary Index
Journal :: 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
Publication Type :: Conference
Accession number :: 111579639
Full Text :: https://doi.org/10.1109/EOSESD.2015.7314746