Cite
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model.
MLA
Tsai, Chih-Chun, and Chien-Tai Lin. “Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model.” IEEE Transactions on Reliability, vol. 64, no. 4, Dec. 2015, pp. 1340–55. EBSCOhost, https://doi.org/10.1109/TR.2015.2419618.
APA
Tsai, C.-C., & Lin, C.-T. (2015). Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model. IEEE Transactions on Reliability, 64(4), 1340–1355. https://doi.org/10.1109/TR.2015.2419618
Chicago
Tsai, Chih-Chun, and Chien-Tai Lin. 2015. “Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model.” IEEE Transactions on Reliability 64 (4): 1340–55. doi:10.1109/TR.2015.2419618.