Highly strained Ge on Si microdisks with silicon nitride stressors.

Details

Language :

English

ISBNs :

9781479989690

Database :

Complementary Index

Journal :

2015 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE)

Publication Type :

Conference

Accession number :

111138935

Full Text :

https://doi.org/10.1109/Group4.2015.7305948