Verification of novel extended mixed-mode S-parameters on three-conductor lines.

Details

Language :

English

ISBNs :

9781479966165

Database :

Complementary Index

Journal :

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Publication Type :

Conference

Accession number :

110297001

Full Text :

https://doi.org/10.1109/ISEMC.2015.7256362