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Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application.
- Source :
- 2015 Symposium on VLSI Circuits (VLSI Circuits); 2015, pT14-T15, 2p
- Publication Year :
- 2015
Details
- Language :
- English
- ISBNs :
- 9784863485020
- Database :
- Complementary Index
- Journal :
- 2015 Symposium on VLSI Circuits (VLSI Circuits)
- Publication Type :
- Conference
- Accession number :
- 110285329
- Full Text :
- https://doi.org/10.1109/VLSIC.2015.7231381