T-junction waveguide experiment to characterize left-handed properties of metamaterials.

Authors :: Hongsheng Chen, D.A.
Lixin Ran, D.A.
Jiangtao Huangfu, D.A.
Xianmin Zhang
Kangsheng Chen, D.A.
Grzegorczyk, Tomasz M.
Jin Au Kong
Source :: Journal of Applied Physics; 9/15/2003, Vol. 94 Issue 6, p3712, 5p, 4 Black and White Photographs, 3 Diagrams, 2 Charts, 1 Graph
Publication Year :: 2003
Abstract: Demonstrates the left-handed property of a metamaterial by measuring the power at the output of a T-junction waveguide loaded with a metamaterial having one edge cut at 45 degrees with respect to the waveguide axis. Use of a periodic arrangement of wires and split-ring resonators; Conditions which suggest a negative index of refraction.

Full Text Access

Tools