Back to Search
Start Over
Muffin-tin potentials in EXAFS analysis.
- Source :
- Journal of Synchrotron Radiation; Sep2015, Vol. 22 Issue 5, p1258-1262, 5p
- Publication Year :
- 2015
-
Abstract
- Muffin-tin potentials are the standard tool for calculating the potential surface of a cluster of atoms for use in the analysis of extended X-ray absorption fine-structure (EXAFS) data. The set of Cartesian coordinates used to define the positions of atoms in the cluster and to calculate the muffin-tin potentials is commonly also used to enumerate the scattering paths used in the EXAFS data analysis. In this paper, it is shown that these muffin-tin potentials are sufficiently robust to be used to examine quantitatively contributions to the EXAFS data from scattering geometries not represented in the original cluster. [ABSTRACT FROM AUTHOR]
- Subjects :
- MUFFIN pans
ATOMS
X-ray absorption
CARTESIAN coordinates
SCATTERING (Physics)
Subjects
Details
- Language :
- English
- ISSN :
- 09090495
- Volume :
- 22
- Issue :
- 5
- Database :
- Complementary Index
- Journal :
- Journal of Synchrotron Radiation
- Publication Type :
- Academic Journal
- Accession number :
- 109016066
- Full Text :
- https://doi.org/10.1107/S1600577515013521