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The structural and optical properties of high quality ZnTe grown in GaAs using ZnSe/ZnTe strained...

Authors :
Tu, R.C.
Su, Y.K.
Chen, H.J.
Huang, Y.S.
Chou, S.T.
Lan, W.H.
Tu, S.L.
Source :
Journal of Applied Physics; 9/1/1998, Vol. 84 Issue 5, p2866, 5p, 2 Black and White Photographs, 3 Graphs
Publication Year :
1998

Abstract

Focuses on the optical and structural characteristics of zinc compound thin films on a gallium compound substrate. Examination of the crystal quality and dislocation density in the epilayer; Performance of modulation spectroscopy; Determining whether the epilayer is under tensile strain.

Details

Language :
English
ISSN :
00218979
Volume :
84
Issue :
5
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
1050074
Full Text :
https://doi.org/10.1063/1.368429