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TiO2/sapphire Beam Splitter for High-order Harmonics.

Authors :
Sanjo, Y.
Murata, M.
Tanaka, Y.
Kumagai, H.
Chigane, M.
Source :
Journal of Laser Micro / Nanoengineering; Nov2012, Vol. 7 Issue 3, p375-379, 5p
Publication Year :
2012

Abstract

TiO<subscript>2</subscript>/sapphire beam splitter (BS) for high-order harmonics was studied and fabricated through taking advantage of the self-limiting nature of atomic layer epitaxy (ALE). Theoretical calculation indicated that the highest reflectivity of the TiO<subscript>2</subscript>/sapphire BS was 44.8 % at 21.24 nm, which corresponds to the 37<superscript>th</superscript>-order harmonics of the 800-nm pump pulse and then the optimal thickness of the TiO<subscript>2</subscript> layer was 67.4 nm. Incident angle was set at 70.5° for TiO<subscript>2</subscript>, which corresponds to the Brewster's angle of the 800-nm pump pulse. Moreover, experimental results indicated that refractive indices (λ = 632.8nm) of the TiO<subscript>2</subscript> films were almost constant at a value of 2.59 and growth rate of TiO<subscript>2</subscript> films was 0.077nm/cycle, which corresponds to 885 cycles in order to deposit the TiO<subscript>2</subscript> layer with the optimal film thickness as an anti-reflection layer. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
18800688
Volume :
7
Issue :
3
Database :
Complementary Index
Journal :
Journal of Laser Micro / Nanoengineering
Publication Type :
Academic Journal
Accession number :
103603064
Full Text :
https://doi.org/10.2961/jlmn.2012.03.0025