Back to Search Start Over

MIM capacitors with various Al2O3 thicknesses for GaAs RFIC application.

Authors :
Zhou Jiahui
Chang Hudong
Liu Honggang
Liu Guiming
Xu Wenjun
Li Qi
Li Simin
He Zhiyi
Li Haiou
Source :
Journal of Semiconductors; May2015, Vol. 36 Issue 5, p1-1, 1p
Publication Year :
2015

Details

Language :
English
ISSN :
16744926
Volume :
36
Issue :
5
Database :
Complementary Index
Journal :
Journal of Semiconductors
Publication Type :
Academic Journal
Accession number :
102954465
Full Text :
https://doi.org/10.1088/1674-4926/36/5/054004