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Scanning Probe Microscopes.

Authors :
Nawrocki, Waldemar
Source :
Introduction to Quantum Metrology; 2015, p237-256, 20p
Publication Year :
2015

Details

Language :
English
ISBNs :
9783319156682
Database :
Complementary Index
Journal :
Introduction to Quantum Metrology
Publication Type :
Book
Accession number :
102740805
Full Text :
https://doi.org/10.1007/978-3-319-15669-9_11