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Study of low frequency noise in vertical NW-Tunnel FETs with different source compositions.

Authors :
Neves, F. S.
Agopian, P. G. D.
Martino, J. A.
Cretu, B.
Vandooren, A.
Rooyackers, R.
Simoen, E.
Thean, A.
Claeys, C.
Source :
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop & International Conference on Ultimate Integration on Silicon; 2015, p149-152, 4p
Publication Year :
2015

Details

Language :
English
ISBNs :
9781479969111
Database :
Complementary Index
Journal :
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop & International Conference on Ultimate Integration on Silicon
Publication Type :
Conference
Accession number :
102551619
Full Text :
https://doi.org/10.1109/ULIS.2015.7063795
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