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The impacts of inverter-like transitions on AC TDDB in a fast switching logic circuit.

Authors :
Yew, T.-Y.
Huang, Y.-C.
Hsieh, M.-H.
Wang, W.
Chou, W.-S.
Kang, P.-Z.
Lee, Y.-H.
Wu, K.
Source :
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW); 2014, p47-50, 4p
Publication Year :
2014

Details

Language :
English
ISBNs :
9781479973088
Database :
Complementary Index
Journal :
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)
Publication Type :
Conference
Accession number :
102535261
Full Text :
https://doi.org/10.1109/IIRW.2014.7049507