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Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB2 thin films.

Authors :
Teng Tan
Wolak, M. A.
Acharya, Narendra
Krick, Alex
Lang, Andrew C.
Sloppy, Jennifer
Taheri, Mitra L.
Civale, L.
Ke Chen
Xi, X. X.
Source :
APL Materials; 2015, Vol. 3 Issue 4, p1-7, 7p
Publication Year :
2015

Abstract

For potential applications in superconducting RF cavities, we have investigated the properties of polycrystalline MgB2 films, including the thickness dependence of the lower critical field H<subscript>c1</subscript>. MgB<subscript>2</subscript> thin films were fabricated by hybrid physical-chemical vapor deposition on (0001) SiC substrate either directly (for epitaxial films) or with a MgO buffer layer (for polycrystalline films). When the film thickness decreased from 300 nm to 100 nm, H<subscript>c1</subscript> at 5 K increased from around 600 Oe to 1880 Oe in epitaxial films and to 1520 Oe in polycrystalline films. The result is promising for using MgB<subscript>2</subscript>/MgO multilayers to enhance the vortex penetration field. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
2166532X
Volume :
3
Issue :
4
Database :
Complementary Index
Journal :
APL Materials
Publication Type :
Academic Journal
Accession number :
102415120
Full Text :
https://doi.org/10.1063/1.4916696