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Design of OLED shorting bar testing waveform based on feed through voltage compensation principle.
- Source :
- Chinese Journal of Liquid Crystal & Displays; Apr2015, Vol. 30 Issue 2, p296-299, 4p
- Publication Year :
- 2015
-
Abstract
- The conventional calculation principle for the feed through voltage relates to capacitance values of OLED body, and capacitance values of different OLED products is variable. A lot of experiments must be done by testing department of OLED manufacturing enterprise in order to get the best capacitance values of OLED body. This paper directly pulls up gate voltage, and then the storage capacitor of OLED body produces a feed through voltage to compensate the feed through voltage generated by the parasitic capacitance between the gate and the drain as the gate voltage closing. Experiment result shows that the total detection rate using the testing waveform based on automatic compensation principle or conventional compensation is consistent, and there is little difference on the detection rate of different defects. [ABSTRACT FROM AUTHOR]
Details
- Language :
- Chinese
- ISSN :
- 10072780
- Volume :
- 30
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- Chinese Journal of Liquid Crystal & Displays
- Publication Type :
- Academic Journal
- Accession number :
- 102138528
- Full Text :
- https://doi.org/10.3788/YJYXS20153002.0296