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Formation of ultralow-reflectance silicon surface by dry etching.

Authors :
Li Zhang
Fang Yang
Jun He
Xian Huang
Dacheng Zhang
Source :
Japanese Journal of Applied Physics; Apr2015, Vol. 54 Issue 4S, p1-1, 1p
Publication Year :
2015

Abstract

In this study, a one-step method of fabricating nano to micro structures was reported. Monte Carlo (MC) simulation and a fluid equation were employed to study the formation and evolution mechanism. To verify the fundamental simulation and hypothetical mechanism, standard surface technology (STS) was used with a phase delay producer to build the etching system. Also, throughout the practical experiment, the relationship between the structure scale and the process parameter was recorded. Lastly, the reflectance was measured to be only 0.9%, proving that this method was very promising for optical application. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00214922
Volume :
54
Issue :
4S
Database :
Complementary Index
Journal :
Japanese Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
101804052
Full Text :
https://doi.org/10.7567/JJAP.54.04DR07