Back to Search
Start Over
Techniques for improving the efficiency of sequential circuit test generation.
- Source :
- Proceedings of the 1999 IEEE ACM International Conference Computer-aided Design; 11/7/1999, p147-151, 5p
- Publication Year :
- 1999
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- Proceedings of the 1999 IEEE ACM International Conference Computer-aided Design
- Publication Type :
- Conference
- Accession number :
- 101398294