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APT: an area-performance-testability driven placement algorithm.

Authors :
Kim, S.
Banerjee, P.
Chickermane, V.
Patel, J. H.
Source :
Proceedings of the 29th ACM/IEEE Design Automation Conference; 7/1/1992, p141-146, 6p
Publication Year :
1992

Details

Language :
English
ISBNs :
9780897915168
Database :
Complementary Index
Journal :
Proceedings of the 29th ACM/IEEE Design Automation Conference
Publication Type :
Conference
Accession number :
101212404

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