BIST with negligible aliasing through random cover circuits.

Authors :: Bogue, T.
Jürgensen, H.
Gössel, M.
Source :: Proceedings of the 1995 Asia & South Pacific Design Automation Conference; 8/1/1995, p35-es, 1p
Publication Year :: 1995

Language :: English
ISBNs :: 9780897917667
Database :: Complementary Index
Journal :: Proceedings of the 1995 Asia & South Pacific Design Automation Conference
Publication Type :: Conference
Accession number :: 101176258
Full Text :: https://doi.org/10.1145/224818.224902