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Perpendicular interface resistance in Co/NbxTi1-x multilayers for normal and superconducting NbTi alloy with x =0.4, 0.6.

Authors :
Huang, S. Y.
Lee, S. F.
Huang, J. C.
Hwang, G. H.
Yao, Y. D.
Source :
Journal of Applied Physics; 5/15/2005, Vol. 97 Issue 10, p10B103-1-10B103-3, 3p, 1 Diagram, 2 Charts, 2 Graphs
Publication Year :
2005

Abstract

We report here the resistance of Co/Nb<subscript>x</subscript>Ti<subscript>1-x</subscript> multilayers, for x=0.4 and 0.6, with current flowing perpendicular to the layer plane at 4.2 K. When NbTi films are sandwiched between Co, we found that there are critical thicknesses of 20 nm for x=0.4 and 27 nm for x=0.6, below which no superconducting transition could be found. Using a series resistor model, we extracted the unit area resistance of one pair of Co/NbTi interfaces and compared with the pure Nb case we have reported. The influence of mean free paths and superconducting coherence lengths is analyzed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
97
Issue :
10
Database :
Complementary Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
100455018
Full Text :
https://doi.org/10.1063/1.1850373