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Nanoscale diffusion tracing by radioactive 8Li tracer.
- Source :
- Japanese Journal of Applied Physics; Nov2014, Vol. 53 Issue 11, p1-1, 1p
- Publication Year :
- 2014
-
Abstract
- We have developed a nanoscale diffusion measurement method using an α-emitting radioactive <superscript>8</superscript>Li tracer. In this method, while implanting a pulsed 8 keV <superscript>8</superscript>Li beam, the α particles emitted at a small angle (10°) relative to the sample surface were detected as a function of time. The method has been successfully applied to measuring lithium diffusion coefficients for an amorphous Li<subscript>4</subscript>SiO<subscript>4</subscript>–Li<subscript>3</subscript>VO<subscript>4</subscript> (LVSO) thin film with a thickness of several hundred nanometers, demonstrating that the present method is sensitive to diffusion coefficients down on the order of 10<superscript>−12</superscript> cm<superscript>2</superscript>/s, which is more sensitive by about two orders of magnitude than that previously achieved. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00214922
- Volume :
- 53
- Issue :
- 11
- Database :
- Complementary Index
- Journal :
- Japanese Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 100233544
- Full Text :
- https://doi.org/10.7567/JJAP.53.110303