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Ultrafast Mapping of Electronic and Nuclear Structure in the Photo Dissociation of Nitrogen Dioxide.

Authors :
Zhang ZY
Restaino L
Sen A
Winghart MO
Coates MR
Odelius M
Kowalewski M
Nibbering ETJ
Rouzée A
Source :
The journal of physical chemistry letters [J Phys Chem Lett] 2024 Dec 05; Vol. 15 (48), pp. 12025-12033. Date of Electronic Publication: 2024 Nov 26.
Publication Year :
2024

Abstract

We investigate the photoinduced dissociation reaction of NO <subscript>2</subscript> → NO + O upon electronic excitation of the X̃ <superscript>2</superscript> A <subscript>1</subscript> (D <subscript>0</subscript> ) to the à <superscript>2</superscript> B <subscript>2</subscript> (D <subscript>1</subscript> ) state by femtosecond X-ray absorption spectroscopy at the nitrogen K-edge. We obtain key insight into the chemical bond breaking event and its associated electronic structural dynamics. Calculations of the photoinduced reaction allow to assign the transient absorption features at time scales of 10-50 fs to wave packet motions in the excited D <subscript>1</subscript> and ground D <subscript>0</subscript> states, followed by the formation of the NO photoproduct with a 255 ± 23 fs time constant. Our analysis shows that there is no direct correlation between the 1s core levels and the electronic ground and excited states transition energies and the bond elongation of NO <subscript>2</subscript> , while en route to dissociation toward the NO + O photoproducts, in the transient nitrogen K-edge spectra. However, simulations predict that for a sufficiently short UV pump pulse, the early wave packet dynamics in the D <subscript>1</subscript> electronic excited state occurring within the first 35 fs along the bending and symmetric stretching modes can be directly mapped in the transient X-ray absorption spectra.

Details

Language :
English
ISSN :
1948-7185
Volume :
15
Issue :
48
Database :
MEDLINE
Journal :
The journal of physical chemistry letters
Publication Type :
Academic Journal
Accession number :
39588803
Full Text :
https://doi.org/10.1021/acs.jpclett.4c02808