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Speckle tracking phase-contrast computed tomography at an inverse Compton X-ray source.

Authors :
Zandarco S
Günther B
Riedel M
Breitenhuber G
Kirst M
Achterhold K
Pfeiffer F
Herzen J
Source :
Optics express [Opt Express] 2024 Jul 29; Vol. 32 (16), pp. 28472-28488.
Publication Year :
2024

Abstract

Speckle-based X-ray imaging (SBI) is a phase-contrast method developed at and for highly coherent X-ray sources, such as synchrotrons, to increase the contrast of weakly absorbing objects. Consequently, it complements the conventional attenuation-based X-ray imaging. Meanwhile, attempts to establish SBI at less coherent laboratory sources have been performed, ranging from liquid metal-jet X-ray sources to microfocus X-ray tubes. However, their lack of coherence results in interference fringes not being resolved. Therefore, algorithms were developed which neglect the interference effects. Here, we demonstrate phase-contrast computed tomography employing SBI in a laboratory-setting with an inverse Compton X-ray source. In this context, we investigate and compare also the performance of the at synchrotron conventionally used phase-retrieval algorithms for SBI, unified modulated pattern analysis (UMPA) with a phase-retrieval method developed for low coherence systems (LCS). We successfully retrieve a full computed tomography in a phantom as well as in biological specimens, such as larvae of the greater wax moth (Galleria mellonella), a model system for studies of pathogens and infections. In this context, we additionally demonstrate quantitative phase-contrast computed tomography using SBI at a low coherent set-up.

Details

Language :
English
ISSN :
1094-4087
Volume :
32
Issue :
16
Database :
MEDLINE
Journal :
Optics express
Publication Type :
Academic Journal
Accession number :
39538663
Full Text :
https://doi.org/10.1364/OE.528701