Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging.

MLA

Mazzella, Lorry, et al. “Extended-Depth of Field Random Illumination Microscopy, EDF-RIM, Provides Super-Resolved Projective Imaging.” Light, Science & Applications, vol. 13, no. 1, Oct. 2024, p. 285. EBSCOhost, https://doi.org/10.1038/s41377-024-01612-0.

APA

Mazzella, L., Mangeat, T., Giroussens, G., Rogez, B., Li, H., Creff, J., Saadaoui, M., Martins, C., Bouzignac, R., Labouesse, S., Idier, J., Galland, F., Allain, M., Sentenac, A., & LeGoff, L. (2024). Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging. Light, Science & Applications, 13(1), 285. https://doi.org/10.1038/s41377-024-01612-0

Chicago

Mazzella, Lorry, Thomas Mangeat, Guillaume Giroussens, Benoit Rogez, Hao Li, Justine Creff, Mehdi Saadaoui, et al. 2024. “Extended-Depth of Field Random Illumination Microscopy, EDF-RIM, Provides Super-Resolved Projective Imaging.” Light, Science & Applications 13 (1): 285. doi:10.1038/s41377-024-01612-0.