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Bulk photovoltaic effect and high mobility in the polar 2D semiconductor SnP 2 Se 6 .

Authors :
Sangwan VK
Chica DG
Chu TC
Cheng M
Quintero MA
Hao S
Mead CE
Choi H
Zu R
Sheoran J
He J
Liu Y
Qian E
Laing CC
Kang MA
Gopalan V
Wolverton C
Dravid VP
Lauhon LJ
Hersam MC
Kanatzidis MG
Source :
Science advances [Sci Adv] 2024 Aug 02; Vol. 10 (31), pp. eado8272. Date of Electronic Publication: 2024 Jul 31.
Publication Year :
2024

Abstract

The growth of layered 2D compounds is a key ingredient in finding new phenomena in quantum materials, optoelectronics, and energy conversion. Here, we report SnP <subscript>2</subscript> Se <subscript>6</subscript> , a van der Waals chiral ( R 3 space group) semiconductor with an indirect bandgap of 1.36 to 1.41 electron volts. Exfoliated SnP <subscript>2</subscript> Se <subscript>6</subscript> flakes are integrated into high-performance field-effect transistors with electron mobilities >100 cm <superscript>2</superscript> /Vs and on/off ratios >10 <superscript>6</superscript> at room temperature. Upon excitation at a wavelength of 515.6 nanometer, SnP <subscript>2</subscript> Se <subscript>6</subscript> phototransistors show high gain (>4 × 10 <superscript>4</superscript> ) at low intensity (≈10 <superscript>-6</superscript> W/cm <superscript>2</superscript> ) and fast photoresponse (< 5 microsecond) with concurrent gain of ≈52.9 at high intensity (≈56.6 mW/cm <superscript>2</superscript> ) at a gate voltage of 60 V across 300-nm-thick SiO <subscript>2</subscript> dielectric layer. The combination of high carrier mobility and the non-centrosymmetric crystal structure results in a strong intrinsic bulk photovoltaic effect; under local excitation at normal incidence at 532 nm, short circuit currents exceed 8 mA/cm <superscript>2</superscript> at 20.6 W/cm <superscript>2</superscript> .

Details

Language :
English
ISSN :
2375-2548
Volume :
10
Issue :
31
Database :
MEDLINE
Journal :
Science advances
Publication Type :
Academic Journal
Accession number :
39083609
Full Text :
https://doi.org/10.1126/sciadv.ado8272