A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits.

MLA

Dong, Rui, et al. “A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits.” Micromachines, vol. 15, no. 4, Apr. 2024. EBSCOhost, https://doi.org/10.3390/mi15040541.

APA

Dong, R., Lu, H., Yang, C., Zhang, Y., Yao, R., Wang, Y., & Zhang, Y. (2024). A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits. Micromachines, 15(4). https://doi.org/10.3390/mi15040541

Chicago

Dong, Rui, Hongliang Lu, Caozhen Yang, Yutao Zhang, Ruxue Yao, Yujian Wang, and Yuming Zhang. 2024. “A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits.” Micromachines 15 (4). doi:10.3390/mi15040541.