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An experimental and numerical study on adhesion force at the nanoscale.

Authors :
Kim SH
Choi PK
Lee YB
Kim TS
Jo MS
Lee SY
Min HW
Yoon JB
Source :
Nanoscale advances [Nanoscale Adv] 2024 Feb 27; Vol. 6 (8), pp. 2013-2025. Date of Electronic Publication: 2024 Feb 27 (Print Publication: 2024).
Publication Year :
2024

Abstract

Adhesion has attracted great interest in science and engineering especially in the field pertaining to nano-science because every form of physical contact is fundamentally a macroscopic observation of interactions between nano-asperities under the adhesion phenomenon. Despite its importance, no practical adhesion prediction model has been developed due to the complexity of examining contact between nano-asperities. Here, we scrutinized the contact phenomenon and developed a contact model, reflecting the physical sequence in which adhesion develops. For the first time ever, our model analyzes the adhesion force and contact properties, such as separation distance, contact location, actual contact area, and the physical deformation of the asperities, between rough surfaces. Through experiments using atomic force microscopy, we demonstrated a low absolute percentage error of 2.8% and 6.55% between the experimental and derived data for Si-Si and Mo-Mo contacts, respectively, and proved the accuracy and practicality of our model in the analysis of the adhesion phenomenon.<br />Competing Interests: The authors declare that they have no competing interests.<br /> (This journal is © The Royal Society of Chemistry.)

Details

Language :
English
ISSN :
2516-0230
Volume :
6
Issue :
8
Database :
MEDLINE
Journal :
Nanoscale advances
Publication Type :
Academic Journal
Accession number :
38633052
Full Text :
https://doi.org/10.1039/d3na01044a