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Revealing the Loss Mechanism of Chemically-Induced Hot Electron Transport.

Authors :
Roh Y
Jin Y
Jeon B
Park Y
Yu K
Park JY
Source :
Nano letters [Nano Lett] 2024 Mar 20; Vol. 24 (11), pp. 3490-3497. Date of Electronic Publication: 2024 Mar 11.
Publication Year :
2024

Abstract

Hot electrons are crucial for unraveling the intrinsic relationship between chemical reactions and charge transfer in heterogeneous catalysis. Significant research focused on real-time detection of reaction-driven hot electron flow (chemicurrent) to elucidate the energy conversion mechanisms, but it remains elusive because carrier generation contributes to only part of the entire process. Here, a theoretical model for quantifying the chemicurrent yield is presented by clarifying the contributions of hot carrier losses from the internal emission and multiple reflections. The experimental chemicurrent yield verifies our model with a reliable mean free path of hot electrons, emphasizing the importance of comprehensive consideration of the transport process besides hot electron generation. Moreover, Pt nanoparticles (NPs)-decorated Au/TiO <subscript>2</subscript> is examined, showing the role of NPs-induced carrier losses in the performance of catalytic nanodiodes. These findings are expected to contribute to understanding the hot electron detection efficiency and designing nanodiodes with enhanced hot carrier flow and catalytic activity.

Details

Language :
English
ISSN :
1530-6992
Volume :
24
Issue :
11
Database :
MEDLINE
Journal :
Nano letters
Publication Type :
Academic Journal
Accession number :
38466136
Full Text :
https://doi.org/10.1021/acs.nanolett.4c00330