Quantification of Crystalline Phases in Hf 0.5 Zr 0.5 O 2 Thin Films through Complementary Infrared Spectroscopy and Ab Initio Supercell Simulations.

MLA

Cervasio, Rebecca, et al. “Quantification of Crystalline Phases in Hf 0.5 Zr 0.5 O 2 Thin Films through Complementary Infrared Spectroscopy and Ab Initio Supercell Simulations.” ACS Applied Materials & Interfaces, vol. 16, no. 3, Jan. 2024, pp. 3829–40. EBSCOhost, https://doi.org/10.1021/acsami.3c13848.

APA

Cervasio, R., Amzallag, E., Verseils, M., Hemme, P., Brubach, J.-B., Infante, I. C., Segantini, G., Rojo Romeo, P., Coati, A., Vlad, A., Garreau, Y., Resta, A., Vilquin, B., Creuze, J., & Roy, P. (2024). Quantification of Crystalline Phases in Hf 0.5 Zr 0.5 O 2 Thin Films through Complementary Infrared Spectroscopy and Ab Initio Supercell Simulations. ACS Applied Materials & Interfaces, 16(3), 3829–3840. https://doi.org/10.1021/acsami.3c13848

Chicago

Cervasio, Rebecca, Emilie Amzallag, Marine Verseils, Pierre Hemme, Jean-Blaise Brubach, Ingrid Cañero Infante, Greta Segantini, et al. 2024. “Quantification of Crystalline Phases in Hf 0.5 Zr 0.5 O 2 Thin Films through Complementary Infrared Spectroscopy and Ab Initio Supercell Simulations.” ACS Applied Materials & Interfaces 16 (3): 3829–40. doi:10.1021/acsami.3c13848.