Defect Contrast with 4D-STEM: Understanding Crystalline Order with Virtual Detectors and Beam Modification.

MLA

Ribet, Stephanie M., et al. “Defect Contrast with 4D-STEM: Understanding Crystalline Order with Virtual Detectors and Beam Modification.” Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 29, no. 3, June 2023, pp. 1087–95. EBSCOhost, https://doi.org/10.1093/micmic/ozad045.

APA

Ribet, S. M., Ophus, C., Dos Reis, R., & Dravid, V. P. (2023). Defect Contrast with 4D-STEM: Understanding Crystalline Order with Virtual Detectors and Beam Modification. Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29(3), 1087–1095. https://doi.org/10.1093/micmic/ozad045

Chicago

Ribet, Stephanie M, Colin Ophus, Roberto Dos Reis, and Vinayak P Dravid. 2023. “Defect Contrast with 4D-STEM: Understanding Crystalline Order with Virtual Detectors and Beam Modification.” Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 29 (3): 1087–95. doi:10.1093/micmic/ozad045.