Cite
Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray Spectroscopy.
MLA
De Backer, Annick, et al. “Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-Ray Spectroscopy.” Small Methods, vol. 6, no. 11, Nov. 2022, p. e2200875. EBSCOhost, https://doi.org/10.1002/smtd.202200875.
APA
De Backer, A., Zhang, Z., van den Bos, K. H. W., Bladt, E., Sánchez-Iglesias, A., Liz-Marzán, L. M., Nellist, P. D., Bals, S., & Van Aert, S. (2022). Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray Spectroscopy. Small Methods, 6(11), e2200875. https://doi.org/10.1002/smtd.202200875
Chicago
De Backer, Annick, Zezhong Zhang, Karel H W van den Bos, Eva Bladt, Ana Sánchez-Iglesias, Luis M Liz-Marzán, Peter D Nellist, Sara Bals, and Sandra Van Aert. 2022. “Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-Ray Spectroscopy.” Small Methods 6 (11): e2200875. doi:10.1002/smtd.202200875.