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Single-exposure X-ray phase imaging microscopy with a grating interferometer.

Single-exposure X-ray phase imaging microscopy with a grating interferometer.

Authors :
Wolf A
Akstaller B
Cipiccia S
Flenner S
Hagemann J
Ludwig V
Meyer P
Schropp A
Schuster M
Seifert M
Weule M
Michel T
Anton G
Funk S
Source :
Journal of synchrotron radiation [J Synchrotron Radiat] 2022 May 01; Vol. 29 (Pt 3), pp. 794-806. Date of Electronic Publication: 2022 Mar 15.
Publication Year :
2022

Abstract

The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X-ray free-electron lasers where intrinsic pulse-to-pulse fluctuations pose a major challenge. In this work, the single-exposure phase imaging capabilities of grating interferometry are characterized by an implementation at the I13-1 beamline of Diamond Light Source (Oxfordshire, UK). For comparison purposes, propagation-based phase contrast imaging was also performed at the same instrument. The characterization is carried out in terms of the quantitativeness and the contrast-to-noise ratio of the phase reconstructions as well as via the achievable spatial resolution. By using a statistical image reconstruction scheme, previous limitations of grating interferometry regarding the spatial resolution can be mitigated as well as the experimental applicability of the technique.<br /> (open access.)

Details

Language :
English
ISSN :
1600-5775
Volume :
29
Issue :
Pt 3
Database :
MEDLINE
Journal :
Journal of synchrotron radiation
Publication Type :
Academic Journal
Accession number :
35511012
Full Text :
https://doi.org/10.1107/S160057752200193X