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Single-exposure X-ray phase imaging microscopy with a grating interferometer.
Single-exposure X-ray phase imaging microscopy with a grating interferometer.
- Source :
-
Journal of synchrotron radiation [J Synchrotron Radiat] 2022 May 01; Vol. 29 (Pt 3), pp. 794-806. Date of Electronic Publication: 2022 Mar 15. - Publication Year :
- 2022
-
Abstract
- The advent of hard X-ray free-electron lasers enables nanoscopic X-ray imaging with sub-picosecond temporal resolution. X-ray grating interferometry offers a phase-sensitive full-field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X-ray free-electron lasers where intrinsic pulse-to-pulse fluctuations pose a major challenge. In this work, the single-exposure phase imaging capabilities of grating interferometry are characterized by an implementation at the I13-1 beamline of Diamond Light Source (Oxfordshire, UK). For comparison purposes, propagation-based phase contrast imaging was also performed at the same instrument. The characterization is carried out in terms of the quantitativeness and the contrast-to-noise ratio of the phase reconstructions as well as via the achievable spatial resolution. By using a statistical image reconstruction scheme, previous limitations of grating interferometry regarding the spatial resolution can be mitigated as well as the experimental applicability of the technique.<br /> (open access.)
Details
- Language :
- English
- ISSN :
- 1600-5775
- Volume :
- 29
- Issue :
- Pt 3
- Database :
- MEDLINE
- Journal :
- Journal of synchrotron radiation
- Publication Type :
- Academic Journal
- Accession number :
- 35511012
- Full Text :
- https://doi.org/10.1107/S160057752200193X