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High optoelectronic performance of a local-back-gate ReS 2 /ReSe 2 heterojunction phototransistor with hafnium oxide dielectric.

Authors :
Li YC
Li XX
Zeng G
Chen YC
Chen DB
Peng BF
Zhu LY
Zhang DW
Lu HL
Source :
Nanoscale [Nanoscale] 2021 Sep 02; Vol. 13 (34), pp. 14435-14441. Date of Electronic Publication: 2021 Sep 02.
Publication Year :
2021

Abstract

A high optoelectronic performance ReS <subscript>2</subscript> /ReSe <subscript>2</subscript> van der Waals (vdW) heterojunction phototransistor utilizing thin hafnium oxide (HfO <subscript>2</subscript> ) as a local-back-gate dielectric layer was prepared and studied. The heterojunction-based phototransistor exhibits a superior electrical performance with a large rectification ratio of ∼10 <superscript>3</superscript> . Furthermore, unlike diode-like heterojunction devices, the innovative introduction of a local-back-gate in this phototransistor provides an outstanding gate-tunable capability with an ultra-low off-state current of 433 fA and a high on/off current ratio of over 10 <superscript>6</superscript> . And under optical excitation of a wide spectrum from 400 to 633 nm, an excellent photodetection responsivity at the 10 <superscript>4</superscript> A W <superscript>-1</superscript> level and the maximum normalized detectivity of 1.8 × 10 <superscript>15</superscript> Jones @ 633 nm have been demonstrated. Such high performances are attributed to the band alignment of the type-II heterojunction and the suppression of dark current by the local-back-gate. This work provides a promising reference for two-dimensional (2D) Re-based heterojunction optoelectronic devices.

Details

Language :
English
ISSN :
2040-3372
Volume :
13
Issue :
34
Database :
MEDLINE
Journal :
Nanoscale
Publication Type :
Academic Journal
Accession number :
34473171
Full Text :
https://doi.org/10.1039/d1nr02728j