Cite
Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines.
MLA
Juliana, Philomin, et al. “Elucidating the Genetics of Grain Yield and Stress-Resilience in Bread Wheat Using a Large-Scale Genome-Wide Association Mapping Study with 55,568 Lines.” Scientific Reports, vol. 11, no. 1, Mar. 2021, p. 5254. EBSCOhost, https://doi.org/10.1038/s41598-021-84308-4.
APA
Juliana, P., Singh, R. P., Poland, J., Shrestha, S., Huerta-Espino, J., Govindan, V., Mondal, S., Crespo-Herrera, L. A., Kumar, U., Joshi, A. K., Payne, T., Bhati, P. K., Tomar, V., Consolacion, F., & Campos Serna, J. A. (2021). Elucidating the genetics of grain yield and stress-resilience in bread wheat using a large-scale genome-wide association mapping study with 55,568 lines. Scientific Reports, 11(1), 5254. https://doi.org/10.1038/s41598-021-84308-4
Chicago
Juliana, Philomin, Ravi Prakash Singh, Jesse Poland, Sandesh Shrestha, Julio Huerta-Espino, Velu Govindan, Suchismita Mondal, et al. 2021. “Elucidating the Genetics of Grain Yield and Stress-Resilience in Bread Wheat Using a Large-Scale Genome-Wide Association Mapping Study with 55,568 Lines.” Scientific Reports 11 (1): 5254. doi:10.1038/s41598-021-84308-4.