Quantitative trace element analysis of microdroplet residues by secondary ion mass spectrometry.

MLA

Odom, R. W., et al. “Quantitative Trace Element Analysis of Microdroplet Residues by Secondary Ion Mass Spectrometry.” Analytical Chemistry, vol. 60, no. 19, Oct. 1988, pp. 2070–75. EBSCOhost, https://doi.org/10.1021/ac00170a018.

APA

Odom, R. W., Lux, G., Fleming, R. H., Chu, P. K., Niemeyer, I. C., & Blattner, R. J. (1988). Quantitative trace element analysis of microdroplet residues by secondary ion mass spectrometry. Analytical Chemistry, 60(19), 2070–2075. https://doi.org/10.1021/ac00170a018

Chicago

Odom, R W, G Lux, R H Fleming, P K Chu, I C Niemeyer, and R J Blattner. 1988. “Quantitative Trace Element Analysis of Microdroplet Residues by Secondary Ion Mass Spectrometry.” Analytical Chemistry 60 (19): 2070–75. doi:10.1021/ac00170a018.