Probing the limits of full-field linear local defect resonance identification for deep defect detection.

MLA

Segers, Joost, et al. “Probing the Limits of Full-Field Linear Local Defect Resonance Identification for Deep Defect Detection.” Ultrasonics, vol. 105, July 2020, p. 106130. EBSCOhost, https://doi.org/10.1016/j.ultras.2020.106130.

APA

Segers, J., Hedayatrasa, S., Poelman, G., Van Paepegem, W., & Kersemans, M. (2020). Probing the limits of full-field linear local defect resonance identification for deep defect detection. Ultrasonics, 105, 106130. https://doi.org/10.1016/j.ultras.2020.106130

Chicago

Segers, Joost, Saeid Hedayatrasa, Gaétan Poelman, Wim Van Paepegem, and Mathias Kersemans. 2020. “Probing the Limits of Full-Field Linear Local Defect Resonance Identification for Deep Defect Detection.” Ultrasonics 105 (July): 106130. doi:10.1016/j.ultras.2020.106130.