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Analytical metrology for nanomaterials: Present achievements and future challenges.

Authors :
López-Sanz S
Guzmán Bernardo FJ
Rodríguez Martín-Doimeadios RC
Ríos Á
Source :
Analytica chimica acta [Anal Chim Acta] 2019 Jun 20; Vol. 1059, pp. 1-15. Date of Electronic Publication: 2019 Feb 21.
Publication Year :
2019

Abstract

Nanoscience and nanotechnology have emerged in recent years as revolutionary trends in almost all fields of activity. Their impact has taken place in the analytical science, too. Firstly, because the use of nanomaterials as analytical tools is more and more frequent and secondly, because the analytical control of nanomaterials in a wide variety of samples is required. In both aspects, analytical metrology for nanomaterials is involved as the scientific discipline responsible for providing reliable information (based on experimental measurements) to end users. This review presents a general view of the present achievements and the future challenges of analytical metrology for nanomaterials. Selected references and a critical discussion are reported for illustrating this important role of the metrology applied to nano-world.<br /> (Copyright © 2019 Elsevier B.V. All rights reserved.)

Details

Language :
English
ISSN :
1873-4324
Volume :
1059
Database :
MEDLINE
Journal :
Analytica chimica acta
Publication Type :
Academic Journal
Accession number :
30876623
Full Text :
https://doi.org/10.1016/j.aca.2019.02.009