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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdays.

Authors :
Dunin-Borkowski RE
Mayer J
Sachse C
Tillmann K
Source :
Ultramicroscopy [Ultramicroscopy] 2019 Aug; Vol. 203, pp. 1. Date of Electronic Publication: 2019 Feb 13.
Publication Year :
2019

Details

Language :
English
ISSN :
1879-2723
Volume :
203
Database :
MEDLINE
Journal :
Ultramicroscopy
Publication Type :
Academic Journal
Accession number :
30792019
Full Text :
https://doi.org/10.1016/j.ultramic.2019.02.008