Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction.

MLA

Mahr, Christoph, et al. “Influence of Distortions of Recorded Diffraction Patterns on Strain Analysis by Nano-Beam Electron Diffraction.” Ultramicroscopy, vol. 196, Jan. 2019, pp. 74–82. EBSCOhost, https://doi.org/10.1016/j.ultramic.2018.09.010.

APA

Mahr, C., Müller-Caspary, K., Ritz, R., Simson, M., Grieb, T., Schowalter, M., Krause, F. F., Lackmann, A., Soltau, H., Wittstock, A., & Rosenauer, A. (2019). Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. Ultramicroscopy, 196, 74–82. https://doi.org/10.1016/j.ultramic.2018.09.010

Chicago

Mahr, Christoph, Knut Müller-Caspary, Robert Ritz, Martin Simson, Tim Grieb, Marco Schowalter, Florian F Krause, et al. 2019. “Influence of Distortions of Recorded Diffraction Patterns on Strain Analysis by Nano-Beam Electron Diffraction.” Ultramicroscopy 196 (January): 74–82. doi:10.1016/j.ultramic.2018.09.010.