Synthetic-wavelength-based dual-comb interferometry for fast and precise absolute distance measurement.

We present an absolute distance measurement system using a phase-stable dual-comb system with 56.09 MHz repetition rate and 2 kHz repetition rate difference. A relative phase stability of 0.1 rad in 0.5 ms between two combs is achieved using a mutual locking scheme. The dual-comb ranging system combines the time-of-flight (TOF) method, synthetic-wavelength interferometry (SWI), and carrier wave interferometry (CWI). Each method provides a particular ambiguity range and resolution, and they can be applied simultaneously and linked to enhance the precision and measurement rate of the ranging system. The experimental results demonstrate that a precision of 1.2 μm is obtained without time averaging, and the precision can be improved to 3 nm with only 10 ms averaging time using the SWI method described in this study. The precision reaches a sub-nanometer when the averaging time exceeds 0.1 s. A system with high accuracy and short averaging time would enhance fast measurement performance in various industrial applications. The ambiguity range is about 2.67 m in our system, we test the performance of the system with 1.5 mm range at 1.5 m distance.