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Science Opportunities at the SwissFEL X-ray Laser.

Authors :
Patterson BD
Beaud P
Braun HH
Dejoiea C
Ingold G
Milne C
Patthey L
Pedrini B
Szlachentko J
Abela R
Source :
Chimia [Chimia (Aarau)] 2014 Feb 26; Vol. 68 (1), pp. 73-78.
Publication Year :
2014

Abstract

Next-generation X-ray sources, based on the X-ray Free Electron Laser (XFEL) concept, will provide highly coherent, ultrashort pulses of soft and hard X-rays with peak intensity many orders of magnitude higher than that of a synchrotron. These pulses will allow studies of femtosecond dynamics at nanometer resolution and with chemical selectivity. They will produce diffraction images of organic and inorganic nanostructures without deleterious effects of radiation damage.

Details

Language :
English
ISSN :
0009-4293
Volume :
68
Issue :
1
Database :
MEDLINE
Journal :
Chimia
Publication Type :
Academic Journal
Accession number :
28982442
Full Text :
https://doi.org/10.2533/chimia.2014.73