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Vertical InAs/InGaAs Heterostructure Metal-Oxide-Semiconductor Field-Effect Transistors on Si.

Authors :
Kilpi OP
Svensson J
Wu J
Persson AR
Wallenberg R
Lind E
Wernersson LE
Source :
Nano letters [Nano Lett] 2017 Oct 11; Vol. 17 (10), pp. 6006-6010. Date of Electronic Publication: 2017 Sep 14.
Publication Year :
2017

Abstract

III-V compound semiconductors offer a path to continue Moore's law due to their excellent electron transport properties. One major challenge, integrating III-V's on Si, can be addressed by using vapor-liquid-solid grown vertical nanowires. InAs is an attractive material due to its superior mobility, although InAs metal-oxide-semiconductor field-effect transistors (MOSFETs) typically suffer from band-to-band tunneling caused by its narrow band gap, which increases the off-current and therefore the power consumption. In this work, we present vertical heterostructure InAs/InGaAs nanowire MOSFETs with low off-currents provided by the wider band gap material on the drain side suppressing band-to-band tunneling. We demonstrate vertical III-V MOSFETs achieving off-current below 1 nA/μm while still maintaining on-performance comparable to InAs MOSFETs; therefore, this approach opens a path to address not only high-performance applications but also Internet-of-Things applications that require low off-state current levels.

Details

Language :
English
ISSN :
1530-6992
Volume :
17
Issue :
10
Database :
MEDLINE
Journal :
Nano letters
Publication Type :
Academic Journal
Accession number :
28873310
Full Text :
https://doi.org/10.1021/acs.nanolett.7b02251