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A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling.

Authors :
Shafie S
Kawahito S
Itoh S
Source :
Sensors (Basel, Switzerland) [Sensors (Basel)] 2008 Mar 18; Vol. 8 (3), pp. 1915-1926. Date of Electronic Publication: 2008 Mar 18.
Publication Year :
2008

Abstract

A dynamic range expansion technique for CMOS image sensors with dual charge storage in a pixel and multiple sampling technique is presented. Each pixel contains a photodiode and a storage diode which is connected to the photodiode via a separation gate. The sensitivity of the signal charge in the storage diode can be controlled either by a separation gate which limits the charge to flow into the storage diode or by controlling the accumulation time in the storage diode. The operation of the sensitivity control with separation gate techniques is simulated and it is found that a blocking layer to the storage diode plays an important role for high controllability of sensitivity of the storage diode. A prototype chip for testing multiple short time accumulations is fabricated and measured.

Details

Language :
English
ISSN :
1424-8220
Volume :
8
Issue :
3
Database :
MEDLINE
Journal :
Sensors (Basel, Switzerland)
Publication Type :
Academic Journal
Accession number :
27879802
Full Text :
https://doi.org/10.3390/s8031915