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Big, Deep, and Smart Data in Scanning Probe Microscopy.
- Source :
-
ACS nano [ACS Nano] 2016 Oct 25; Vol. 10 (10), pp. 9068-9086. Date of Electronic Publication: 2016 Sep 27. - Publication Year :
- 2016
-
Abstract
- Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.
Details
- Language :
- English
- ISSN :
- 1936-086X
- Volume :
- 10
- Issue :
- 10
- Database :
- MEDLINE
- Journal :
- ACS nano
- Publication Type :
- Academic Journal
- Accession number :
- 27676453
- Full Text :
- https://doi.org/10.1021/acsnano.6b04212