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Big, Deep, and Smart Data in Scanning Probe Microscopy.

Authors :
Kalinin SV
Strelcov E
Belianinov A
Somnath S
Vasudevan RK
Lingerfelt EJ
Archibald RK
Chen C
Proksch R
Laanait N
Jesse S
Source :
ACS nano [ACS Nano] 2016 Oct 25; Vol. 10 (10), pp. 9068-9086. Date of Electronic Publication: 2016 Sep 27.
Publication Year :
2016

Abstract

Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.

Details

Language :
English
ISSN :
1936-086X
Volume :
10
Issue :
10
Database :
MEDLINE
Journal :
ACS nano
Publication Type :
Academic Journal
Accession number :
27676453
Full Text :
https://doi.org/10.1021/acsnano.6b04212