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Baseline correction of AFM force curves in the force-time representation.
- Source :
-
Microscopy research and technique [Microsc Res Tech] 2016 Nov; Vol. 79 (11), pp. 1045-1049. Date of Electronic Publication: 2016 Aug 04. - Publication Year :
- 2016
-
Abstract
- This note reports on the proper correction of force data acquired with an atomic force microscope (AFM). The force-time representation is hereby used to obtain the correction factors for the overall offset and slope for a single force-time curve, as the initial force, F <subscript>0</subscript>  = F(t <subscript>0</subscript> ), and the rate of change in the force per unit of time, dF/dt, respectively. The report shows that a complete set of force data, including the approach, delay and retraction regions, can be simultaneously corrected in the force-time representation by subtracting the line CL <subscript>t</subscript> = F <subscript>0</subscript>  + dF/dt·t to the experimental data. The method described here outperforms the one commonly employed in the correction of AFM force curves and highlights the convenience of using the force-time representation for force data processing wherein the artifactual behavior can be expressed as a single, differentiable function of time.<br /> (© 2016 Wiley Periodicals, Inc.)
Details
- Language :
- English
- ISSN :
- 1097-0029
- Volume :
- 79
- Issue :
- 11
- Database :
- MEDLINE
- Journal :
- Microscopy research and technique
- Publication Type :
- Academic Journal
- Accession number :
- 27488016
- Full Text :
- https://doi.org/10.1002/jemt.22742