Cite
Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy.
MLA
Duay, Jonathon, et al. “Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy.” ACS Applied Materials & Interfaces, vol. 8, no. 27, July 2016, pp. 17642–50. EBSCOhost, https://doi.org/10.1021/acsami.6b03822.
APA
Duay, J., Schroder, K. W., Murugesan, S., & Stevenson, K. J. (2016). Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy. ACS Applied Materials & Interfaces, 8(27), 17642–17650. https://doi.org/10.1021/acsami.6b03822
Chicago
Duay, Jonathon, Kjell W Schroder, Sankaran Murugesan, and Keith J Stevenson. 2016. “Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy.” ACS Applied Materials & Interfaces 8 (27): 17642–50. doi:10.1021/acsami.6b03822.